BTS2048-VL-TEC

High speed TE cooled CCD spectroradiometer with a wide dynamic range for CW and pulsed measurements of irradiance/illuminance, spectrum, luminous color, and color rendering index. Accessories for measurement of other parameters

Compact device. BiTec detector with back-thinned TE cooled CCD (2048 pixels, 2 nm optical resolution, electronic shutter) and Si-photodiode with V(lambda) filter. Optical bandwidth correction (CIE214). Filter wheel with shutter and attenuation filters. Input lens with a diffusor window that has a cosine field of view. Automatic PWM synchronization

Spectral: 0.2 lx to 3E8 lx 280 nm to 1050 nm (min. level by white LED with low saturation). Integral: photometric 360 nm to 830 nm, 0.1 lx Noise signal up to 3E8 lx

CCD spectroradiometer for design applications. Module for integration in test systems for front-end and back-end LED binning

Factory calibration. Traceable to international calibration standards

Spectral irradiance (W/(m² nm)), irradiance (W/m²), illuminance (lx), spectral radiant intensity (W/(sr nm)), radiant Intensity (W/sr), luminous intensity (cd), dominant wavelength, peak wavelength, center wavelength, centroid wavelength, x, y, u´, v´, X,Y,Z, delta uv, color temperature, color rendering index (CRI) Ra, R1-R15, TM-30-15, CQS, CIE-170, etc.. Option integrating sphere: in addition spectral flux (W/nm) and luminous flux (lm) Option goniometer: in addition radiant intensity (W/sr) distribution and luminous intensity (cd) distribution

Accuracy class B according to DIN 5032 and CIE No. 69
Accuracy class A for f1`, u, f3 and f4 according to DIN 5032 and CIE No. 69

Diffusor, cosine corrected field of view (f2 ≤ 3 %)

4 positions (open, closed, OD1, OD2). Use for remote dark current measurement and dynamic range extension.

Parallel measurement with diode and array is possible, thereby linearity correction of the array through the diode and online correction of the spectral mismatch of the diode through a*(s_z(λ)) respectively F*(s_z(λ)).

Spectral irradiance

Spectral irradiance responsivity (350 - 1050) nm

2 μs - 60 s        *1

(280 -1050) nm

2 nm

~0.4 nm/Pixel

2048

One stage cooled highly sensitive back-thinned CCD chip

16bit

± 0.2 nm

± 0.5 nm           *2

± 0.0015 (Standard illuminant A)
± 0.0020 (common LED)

± 0.0001

Standard illuminant A 30K; LED up to +/- 1.5 % depending of the LED spectrum

mathematical online band-pass correction is supported

completely linearized chip >99.6%

2E-4           *3

5 cts     *4

5000        *5

>10 Magnitudes

(1E-6 - 1E5) W/(m²nm)           *6*7

Ra and R1 to R15

10 lx        2,5 s           *10
100 lx      250 ms      *10
1000 lx    25 ms        *10

Spectral responsivity with fine CIE photometric matching. Online correction of the photometric matching through spectral measurement data (spectral missmatch factor correction).

Nine (9) measurement ranges with transcendent offset correction

Max measureable illuminance value 3E8lx ^*7
Noise equivalent illuminance value 1E-1lx

Illuminance ± 2,2 %

≤ 6 % (uncorrected)

≤ 1.5 % (f1' a*(s_z(λ)) respectively F*(s_z(λ)) corrected by spectral data, done automatically by BTS technology)

32bit for device control,16bit for CCD array control, 8bit for photodiode control

USB V2.0, Ethernet (LAN UDP protocol), RS232, RS485

Standard for 2048 float array values via ethernet 7ms, via USB 2.0 140 ms

2x (0 - 25) VDC, 1x optocoupler isolated 5 V / 5 mA

2x open collector, max. 25 V, max. 500 mA

Trigger input incorporated (different options, rising/falling edge, delayed, etc.)

User software S-BTS2048
Optional software development kit S-SDK-BTS2048 for user software set-ups based on .dll‘s in C, C++,C# or in LabView.

With power supply: DC Input 5V (±10 %) at 700 mA
With USB bus (500mA) ^*8

103 mm x 107 mm x 52 mm (Length x Width x Height)

500g

Tripod and M6 screw threads

Front adapter UMPA-1.0-HL for use with integrating sphere port-frame UMPF-1.0-HL

Storage: (-10 to 50) °C

Operation: (10 to 30) °C           *9

*1 It is recommended to perform a new dark signal measurement for every change in the integration time
*2 typical value, the uncertainty of the dominant wavelength depends on the spectral distribution of the LED
*3 typical value, measured 100nm left of the peak of a cold white broadband LED
*4 *5 typical value measured without averaging for a 4ms measurement time and full scale control of the array. Averaging results in quadratic rise of the S/N
i.e. quadratic fall of the base noise e.g. averaging to a factor 100 improves the S/N by a factor 10
*6 Minimum 500/1 S/N. Maximum at full scale control.
*7 Irradiation only allowed for a short time so as to avoid thermal damage
*8 during USB connection, not all functions are available due to the limited current supply e.g. no Ethernet and TEC cooling
*9 Device required for temperature stabilization in approx. 25min. In measurement is performed in the warm-up phase, or if measurements are performed
under varying temperatures, dark signal measurement is required for each measurement
*10 measurement of a white LED and 20000 counts (signal-dark) saturation

CCD Chip: ≤ ± 0.25 °C

(5E-9 - 5E2) W/nm

(3E-5 - 1E5) lm

150 mm

measurement with 20000 cts:

1 lm      80 ms
10 lm    8 ms
100 lm  800 μs

optimized measurement time with 5000 cts and noise reduction:

10 lm    2 ms

Luminous  flux: ± 4 %

Spectral radiant power:

Spectral radiant power responsivity (350 - 1050) nm

(1E-8 - 1E3) W/nm

(7E-5 - 2E5) lm

210 mm

measurement with 20000 cts:

1 lm       160 ms
10 lm     16 ms
100 lm   1600 μs

optimized measurement time with 5000 cts and noise reduction:

10 lm     4 ms

Luminous  flux: ± 4 %

Spectral radiant power:

Spectral radiant power responsivity (350 - 1050) nm

(2E-7 - 2E4) W/nm

(1E-3 - 4E6) lm

1000 mm

measurement with 20000 cts:

10 lm        450 ms
100 lm      45 ms
1000 lm    4,5 s

optimized measurement time with 5000 cts and noise reduction:

10 lm        112 ms

Luminous  flux: ± 4 %

Spectral radiant power:

Spectral radiant power responsivity (350 - 1050) nm

(1E-6 - 1E5) W/(sr nm)  ; by 1m measurement distance

(1E-1 - 3E8) cd ; by 1m measurement distance

Luminous intensity: ± 4 %

Spectral Radiant intensity:

Spectral radiant intensity responsivity (350 - 1050) nm

(5E-8 - 5E3) W/nm

(3E-4 - 1E6) cd

Luminous intensity ILED-B: ± 4 %

Spectral Radiant intensity ILED-B:

Spectral radiant intensity responsivity (350 - 1050) nm

Measuring device, hard cover box, users guide, S-BTS2048 software, calibration certificate.

Calibration of the BTS2048-VL from 280 nm to 1050 nm with calibration certificate.

Calibration of the BTS2048-VL from 280 nm to 1050 nm with calibration certificate. Including determination and implementation of stray light matrix.

Re-calibration of the BTS2048-VL with calibration certificate

Re-calibration of the BTS2048-VL from 280 nm to 1050 nm with calibration certificate.

Re-calibration of the BTS2048-VL from 280 nm to 1050 nm with calibration certificate. Including determination and implementation of stray light matrix.

Front tube to limit the field of view of spectralradiometer BTS2048-VL to 20 mm or 2.2 mm diameter in 200 mm distance. For blue light hazard applications.

Front tube to limit the field of view of spectralradiometer BTS2048-VL to 20 mm or 2.2 mm diameter in 200 mm distance. Tube manufactured of aluminum including black inner coating. Suitable for higher temperatures at measurement location.  For blue light hazard applications.

Software development kit, software CD with users guide.